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IEC – The company IEC is world-leading organization, which creates and issues International standards for all electrical, electronic and other related technologies known generally as electro-technologies. Wherever, there is electricity and electronics you can find the company IEC, which promotes the safety and performance, the environment, electrical energy efficiency and renewable energy. The company IEC also administers conformity assessment systems, which certify that the equipment, systems or components comply with International Standards of this company.
Electrical installations for lighting and beaconing of aerodromes - Connecting devices - General requirements and tests
(Installations electriques pour l´eclairage et le balisage des aerodromes - Dispositifs de connexion - Exigences generales et essais)
Standard published on 24.6.2020
Selected format:Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 1: Classification of defects
Standard published on 30.1.2019
Selected format:Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 2: Test method for defects using optical inspection
Standard published on 30.1.2019
Selected format:
Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence
(Dispositifs a semiconducteurs - Criteres de reconnaissance non destructifs des defauts au sein d’une plaquette homoepitaxiale de carbure de silicium pour des dispositifs d’alimentation - Partie 3 : Methode d’essai pour les defauts a l’aide de la photoluminescence)
Standard published on 13.7.2020
Selected format:Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 4: Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence
Standard published on 27.7.2022
Selected format:Industrial-process measurement, control and automation - Framework for functional safety and security
Standard published on 20.5.2019
Selected format:Ultrasonics - Field characterization - Infrared imaging techniques for determining temperature elevation in tissue-mimicking material and at the radiation surface of a transducer in still air
Standard published on 15.2.2019
Selected format:Power supplying scheme for wearable system and equipment
Standard published on 14.12.2016
Selected format:Photonic integrated circuits - Part 1: Introduction and roadmap for standardization
Standard published on 11.5.2017
Selected format:
Dedicated radionuclide imaging devices - Characteristics and test conditions - Part 1: Cardiac SPECT
(Dispositifs d´imagerie par radionucleides dedies - Caracteristiques et conditions d´essai - Partie 1: SPECT pour scintigraphie cardiaque)
Standard published on 27.10.2020
Selected format:Latest update: 2025-04-28 (Number of items: 2 197 482)
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