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Fixed capacitors for use in electronic equipment - Part 14-2: Blank detail specification - Fixed capacitors for electromagnetic interference suppression and connection to the supply mains - Safety tests only
Standard published on 1.4.2026
Selected format:Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Standard published on 1.4.2026
Selected format:Semiconductor devices - Mechanical and climatic test methods - Part 22-1: Bond strength - Wire bond pull test methods
Standard published on 1.4.2026
Selected format:Semiconductor devices - Mechanical and climatic test methods - Part 22-2: Bond strength - Wire bond shear test methods
Standard published on 1.4.2026
Selected format:Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
Standard published on 1.4.2026
Selected format:Optical fibre cables - Part 1-107: Generic specification - Basic optical cable test procedures - Mechanical test methods - Torsion, method E7
Standard published on 1.4.2026
Selected format:Optical fibre cables - Part 1-129: Generic specification - Basic optical cable test procedures - Mechanical tests methods - Straight midspan access to optical elements, Method E29
Standard published on 1.4.2026
Selected format:Optical fibre cables - Part 1-130: Generic specification - Basic optical cable test procedures - Mechanical tests methods - Coefficient of friction between cables, Methods E30
Standard published on 1.4.2026
Selected format:Optical fibre cables - Part 1-207: Generic specification - Basic optical cable test procedures - Environmental test methods - Nuclear radiation, Method F7
Standard published on 1.4.2026
Selected format:Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 1: General and guidance
Change published on 1.4.2026
Selected format:Latest update: 2026-04-17 (Number of items: 2 274 270)
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