Standards STN - Slovak standards - Page 46

Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General

Standard published on 1.10.2017

Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms

Standard published on 1.10.2017

Electronic components. Reliability. Reference conditions for failure rates and stress models for conversion

WITHDRAWN published on 1.10.2001

Electric components - Reliability - Reference conditions for failure rates and stress models for conversion

WITHDRAWN published on 1.4.2012

Mocninový model. Testy dobrej zhody a metódy odhadu parametrov (Norma na priame používanie ako STN).

Standard published on 1.1.2014

Reliability engineering. Single sampling acceptance plans based on exponential distribution of time to failure

Standard published on 1.7.1981

Reliability engineering. Single sampling attribute acceptance plans based on Weibull distribution of time to failure

Standard published on 1.11.1980

Open systems dependability

Standard published on 1.3.2019

Dependability reviews during the life cycle

Standard published on 1.9.2020

Reliability engineering. Maintenance. Terms and definitions

WITHDRAWN published on 1.11.1986