Standard Guide for Handling Specimens Prior to Surface Analysis
STANDARD published on 1.5.2009
Designation standards: ASTM E1829-09
Note: WITHDRAWN
Publication date standards: 1.5.2009
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
Auger electron spectroscopy, secondary ion mass spectrometry, specimen handling, surface analysis, X-ray photoelectron spectroscopy, Specimen preparation (for testing)--spectrochemical analysis, Surface analysis--spectrochemical analysis, Auger electron spectroscopy (AES), SIMS (secondary ion mass spectrometry), X-ray photoelectron spectroscopy (XPS), ICS Number Code 71.040.50 (Physicochemical methods of analysis)