Standard Test Methods for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage

The information about the standard:

Designation standards: ASTM F391-96
Note: WITHDRAWN
Publication date standards: 1.1.1996
The number of pages: 9
Approximate weight : 27 g (0.06 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F391-96 :

Keywords:
CMSPV (constant magnitude surface photovoltage) method, Diffusion length, Electrical conductors,emsemiconductors, LPVCPF (linear photovoltage/constant photon flux) method, Minority carriers, Silicon semiconductors, Single crystal silicon semiconductors, Surface analysis,emelectronic components/devices, Surface photovoltage (SPV), minority carrier diffusion length,emextrinsic single-crystal, semiconductors/homoepitaxial layers, by steady-state surface, photovoltage (SPV), test,,Order Form