ASTM F978-02

Standard Test Method for Characterizing Semiconductor Deep Levels by Transient Capacitance Techniques (Withdrawn 2003)

STANDARD published on 10.1.2001

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The information about the standard:

Designation standards: ASTM F978-02
Note: WITHDRAWN
Publication date standards: 10.1.2001
The number of pages: 8
Approximate weight : 24 g (0.05 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F978-02 :

Keywords:
activation energy, deep levels, DLTS, semiconductor silicon, trap density, transient capacitance, ICS Number Code 29.045 (Semiconducting materials)