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IEC 62951-8-ed.1.0

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory

STANDARD published on 19.1.2023

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The information about the standard:

Designation standards: IEC 62951-8-ed.1.0
Publication date standards: 19.1.2023
The number of pages: 14
Approximate weight : 42 g (0.09 lbs)
Country: International technical standard
Category: Technical standards IEC

Annotation of standard text IEC 62951-8-ed.1.0 :

IEC 62951-8:2023 (E) defines terms and specifies the test method for evaluating the stretchability, flexibility, and stability of flexible resistive memory. The test method descriptions include experimental procedures and the equipment to be used. It also includes general requirements for test conditions such as the temperature and relative humidity of the testing environment. The test method described in this document focuses on stability evaluation rather than reliability.