IEC 62951-9-ed.1.0

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells

STANDARD published on 14.12.2022

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The information about the standard:

Designation standards: IEC 62951-9-ed.1.0
Publication date standards: 14.12.2022
The number of pages: 18
Approximate weight : 54 g (0.12 lbs)
Country: International technical standard
Category: Technical standards IEC

Annotation of standard text IEC 62951-9-ed.1.0 :

IEC 62951-9:2022(E) specifies the test methods for evaluating the performance of unipolar-type one transistor one resistor (1T1R) resistive memory cells. The performance test methods in this document include read, forming, SET, RESET, endurance and retention. This document is applicable to flexible devices as well as rigid resistive memory devices without any limitations prone to device technology and size.