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IEC 63287-2-ed.1.0

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

STANDARD published on 29.3.2023

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The information about the standard:

Designation standards: IEC 63287-2-ed.1.0
Publication date standards: 29.3.2023
The number of pages: 30
Approximate weight : 90 g (0.20 lbs)
Country: International technical standard
Category: Technical standards IEC

Annotation of standard text IEC 63287-2-ed.1.0 :

IEC 63287-2:2023 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications. L’IEC 63287-2:2023 fournit des lignes directrices pour lelaboration de plans de qualification de la fiabilite a l’aide du concept de profil de mission, sur la base des conditions environnementales et de l’utilisation prevue du produit. Le present document n’est pas destine aux applications militaires et spatiales.