Optical metrology of microtopographies - Calibration of interferometers and interference microscopes for form measurement.
STANDARD published on 1.2.2020
Designation standards: VDI/VDE 2655Blatt1.3
Publication date standards: 1.2.2020
The number of pages: 50
Approximate weight : 150 g (0.33 lbs)
Country: German technical standard
Category: Technical standards VDI
Optische Messtechnik an Mikrotopografien - Kalibrieren von flächenhaft messenden Interferometern und Interferenzmikroskopen für die Formmessung.