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Standard Guide for Procedures for Specimen Preparation and Mounting in Surface Analysis
STANDARD published on 10.9.1997
Designation standards: ASTM E1078-97
Note: WITHDRAWN
Publication date standards: 10.9.1997
SKU: NS-40358
The number of pages: 9
Approximate weight : 27 g (0.06 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
auger electron spectroscopy, secondary ion mass spectroscopy, surface analysis, x-ray photoelectron spectroscopy, ICS Number Code 71.040.50 (Physicochemical methods of analysis)
1. Scope | ||||||||||||
1.1 This guide covers specimen preparation and mounting prior to, during, and following surface analysis. 1.2 This guide applies to the following surface analysis disciplines: 1.2.1 Auger electron spectroscopy (AES), 1.2.2 X-ray photoelectron spectroscopy (XPS or ESCA), and 1.2.3 Secondary ion mass spectrometry, SIMS. 1.2.4 Although primarily written for AES, XPS, and SIMS, methods will also apply to many surface sensitive analysis methods such as ion scattering spectrometry, low energy electron diffraction, and electron energy loss spectroscopy, where specimen handling can influence surface sensitive measurements. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. |
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2. Referenced Documents | ||||||||||||
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