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Standard Guide for Worldwide Published Standards Relating to Particle and Spray Characterization (Withdrawn 2014)
STANDARD published on 1.11.2009
Designation standards: ASTM E1919-09
Note: WITHDRAWN
Publication date standards: 1.11.2009
SKU: NS-43570
The number of pages: 7
Approximate weight : 21 g (0.05 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
centrifugal sedimentation, classification, density, electrical sensing, gravity sedimentation, image analysis, laser diffraction, particle size, particle characterization, photon correlation spectroscopy, pore size distribution, porosity, representation and treatment of data, sieving, single particle light interaction, small angle x-ray scattering and sampling, surface area measurement, Centrifugal sedimentation, Gravity sedimentation, Laser diffraction, Particle characterization
Significance and Use |
Reported particle size measurement is a function of both the actual dimension and/or shape factor as well as the particular physical or chemical properties of the particle being measured. Caution is required when comparing data from instruments operating on different physical or chemical parameters or with different particle size measurement ranges. Sample acquisition, handling and preparation can also affect reported particle size results. |
1. Scope |
1.1 This guide covers the awareness and use of available standard methods for characterizing solid and liquid particles, and provides information for subsequent evaluation and standardization. 1.2 The principal purpose of this guide is the identification of particle characterization standard methods that have been developed and published by various standards organizations worldwide. Although this is an extensive list of methods, it is not all inclusive. WD working drafts, CD committee drafts, DIS draft International Standards and FDIS final Draft International Standards may not be completed documents. These standards have been divided into the following twelve sections related to particle characterization. |
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