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WITHDRAWN ASTM E673-03 1.12.2003 preview

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ASTM E673-03

Standard Terminology Relating to Surface Analysis (Withdrawn 2012)



STANDARD published on 1.12.2003


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The information about the standard:

Designation standards: ASTM E673-03
Note: WITHDRAWN
Publication date standards: 1.12.2003
SKU: NS-47610
The number of pages: 10
Approximate weight : 30 g (0.07 lbs)
Country: American technical standard
Category: Technical standards ASTM

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Annotation of standard text ASTM E673-03 :

Keywords:

terminology, surface analysis, ICS Number Code 01.040.17 (Metrology and measurement. Physical phenomena (Vocabularies)), 17.040.20 (Properties of surfaces)

Additional information

 
1. Scope

1.1 This terminology is related to the various disciplines involved in surface analysis.

1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).
 

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