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ASTM F1996-06
Standard Test Method for Silver Migration for Membrane Switch Circuitry
STANDARD published on 1.7.2006
The information about the standard:
Designation standards: ASTM F1996-06
Note: WITHDRAWN
Publication date standards: 1.7.2006
SKU: NS-52382
The number of pages: 2
Approximate weight : 6 g (0.01 lbs)
Country: American technical standard
Category: Technical standards ASTM
Annotation of standard text ASTM F1996-06 :
Keywords:
membrane switch, silver dendrite, silver migration, ICS Number Code 77.120.99 (Other non-ferrous metals and their alloys)
Additional information
| Significance and Use | ||||
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The effects of silver migration are short circuiting or reduction in insulation resistance. It is evidenced by staining or dicoloration between the cathode and anode conductive traces. Accelerated testing may be accomplished by increasing the voltage over the specified voltages. (A typical starting point would be 5Vdc 50mA). |
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| 1. Scope | ||||
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1.1 This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential. 1.2 Silver migration will occur when special conditions of moisture and electrical energy are present. |
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| 2. Referenced Documents | ||||
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