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Standard Method for Measuring and Counting Particulate Contamination on Surfaces
STANDARD published on 10.5.2000
Designation standards: ASTM F24-00
Note: WITHDRAWN
Publication date standards: 10.5.2000
SKU: NS-53772
The number of pages: 4
Approximate weight : 12 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
optical particle counting, particulate contamination, size distribution analysis, surfaces, ICS Number Code 17.040.20 (Properties of surfaces)
1. Scope |
1.1 This method covers the size distribution analysis of particulate contamination, 5 m or greater in size, either on, or washed from, the surface of small electron-device components. A maximum variation of two to one (33 % of the average of two runs) should be expected for replicate counts on the same sample. Note 1--For satisfactory results on clean parts, it is recommended that all procedures involved in sample preparation be conducted under a dust shield. |
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