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Standard Method for Measuring and Counting Particulate Contamination on Surfaces
STANDARD published on 1.4.2009
Designation standards: ASTM F24-09
Note: WITHDRAWN
Publication date standards: 1.4.2009
SKU: NS-53774
The number of pages: 4
Approximate weight : 12 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
optical particle counting, particulate contamination, size distribution analysis, surfaces, Particulate contamination (aerospace environments), Size/size distribution analysis, Surface analysis--aerospace materials, ICS Number Code 17.040.20 (Properties of surfaces)
1. Scope |
1.1 This test method covers the size distribution analysis of particulate contamination, 5 μm or greater in size, either on, or washed from, the surface of small electron-device components. A maximum variation of two to one (±33 % of the average of two runs) should be expected for replicate counts on the same sample. 1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. |
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