ASTM F391-96

Standard Test Methods for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage



STANDARD published on 1.1.1996


Language
Format
AvailabilityIN STOCK
Price83.00 USD excl. VAT
83.00 USD

The information about the standard:

Designation standards: ASTM F391-96
Note: WITHDRAWN
Publication date standards: 1.1.1996
SKU: NS-55134
The number of pages: 9
Approximate weight : 27 g (0.06 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F391-96 :

Keywords:

CMSPV (constant magnitude surface photovoltage) method, Diffusion length, Electrical conductors,emsemiconductors, LPVCPF (linear photovoltage/constant photon flux) method, Minority carriers, Silicon semiconductors, Single crystal silicon semiconductors, Surface analysis,emelectronic components/devices, Surface photovoltage (SPV), minority carrier diffusion length,emextrinsic single-crystal, semiconductors/homoepitaxial layers, by steady-state surface, photovoltage (SPV), test,,Order Form

We recommend:

Technical standards updating

Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.

Would you like to know more? Look at this page.




Cookies Cookies

We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.

You can refuse consent here.

Here you can customize your cookie settings according to your preferences.

We need your consent to use the individual data so that you can see information about your interests, among other things.