ASTM F397-93(1999)

Standard Test Method for Resistivity of Silicon Bars Using a Two-Point Probe



STANDARD published on 1.1.1999


Language
Format
AvailabilityIN STOCK
Price91.00 USD excl. VAT
91.00 USD

The information about the standard:

Designation standards: ASTM F397-93(1999)
Note: WITHDRAWN
Publication date standards: 1.1.1999
SKU: NS-55148
The number of pages: 11
Approximate weight : 33 g (0.07 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F397-93(1999) :

Keywords:

polysilicon, resistivity, silicon, two-point probe, ICS Number Code 77.040.30 (Chemical analysis of metals)



Cookies Cookies

We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.

You can refuse consent here.

Here you can customize your cookie settings according to your preferences.

We need your consent to use the individual data so that you can see information about your interests, among other things.