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ASTM F77-69(1996)
Test Method for Apparent Density of Ceramics for Electron Device and Semiconductor Application (Withdrawn 2001)
STANDARD published on 1.1.1996
The information about the standard:
Designation standards: ASTM F77-69(1996)
Note: WITHDRAWN
Publication date standards: 1.1.1996
SKU: NS-56390
The number of pages: 2
Approximate weight : 6 g (0.01 lbs)
Country: American technical standard
Category: Technical standards ASTM
Annotation of standard text ASTM F77-69(1996) :
Keywords:
Ceramic materials-electrical/electronic devices, Density-electronic applications, Electronic materials/applications-ceramics, apparent density of ceramics (for electron device/semiconductor, application), ICS Number Code 29.045 (Semiconducting materials), 81.060.20 (Ceramic products)
Additional information
| 1. Scope |
|
1.1 This test method covers the determination of the apparent density of ceramic parts, used in electron device and semiconductor applications, with a maximum dimension of 25 mm (1 in.) and having zero or discontinuous porosity. 1.2 The values stated in SI units are to be regarded as the standard. The values in parentheses are for information only. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability or regulatory limitations prior to use. |
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