ČSN EN 60749-5-ed.2 (358799)

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

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STANDARD published on 1.12.2017


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The information about the standard:

Designation standards: ČSN EN 60749-5-ed.2
Classification mark: 358799
Catalog number: 503885
Publication date standards: 1.12.2017
SKU: NS-802259
The number of pages: 20
Approximate weight : 60 g (0.13 lbs)
Country: Czech technical standard
Category: Technical standards ČSN

The category - similar standards:

Semiconductor devices in general

Annotation of standard text ČSN EN 60749-5-ed.2 (358799):

Tato norma poskytuje zkoušku životnosti konstantní teplotou a vlhkostí při elektrické polarizaci za účelem vyhodnocení spolehlivosti nehermeticky zapouzdřených pevnofázových součástek ve vlhkém prostředí. Tato zkouška je považována za destruktivní

These changes apply to this standard:

ČSN EN 60749-5-ed.2:2017/Z1 (358799) Change

Polovodičové součástky - Mechanické a klimatické zkoušky - Část 5: Zkouška životnosti konstantní teplotou a vlhkostí při elektrické polarizaci.

Change published on 1.7.2024

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