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Endurance test methods for die attach materials - Part 2: Temperature cycling test method for die attach materials applied to discrete type power electronic devices
Translate name
STANDARD published on 1.5.2024
Designation standards: ČSN EN IEC 63215-2
Classification mark: 359380
Catalog number: 518767
Publication date standards: 1.5.2024
SKU: NS-1181040
The number of pages: 32
Approximate weight : 96 g (0.21 lbs)
Country: Czech technical standard
Category: Technical standards ČSN
This part of IEC 63215 applies to the die attach materials and joining system applied to discrete type power electronic devices.
This document specifies the temperature cycling test method which takes into account the actual usage conditions of discrete type power electronic devices to evaluate reliability of the die attach joint materials and joining system, and establishes a classification level for joining reliability (reliability performance index).
The test method specified in this document is not intended to evaluate power semiconductor devices themselves.
The test method specified in this document is not regarded as the one for use to guarantee the reliability of the power semiconductor device packages.
NOTE - The test result obtained using this document will not be used as absolute quantitative data, but for intercomparison with the other die attach materials results using the same setup
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