ČSN EN IEC 63287-2 (358777)

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

Translate name

STANDARD published on 1.12.2023


Language
Format
AvailabilityIN STOCK
Price14.50 USD excl. VAT
14.50 USD

The information about the standard:

Designation standards: ČSN EN IEC 63287-2
Classification mark: 358777
Catalog number: 517541
Publication date standards: 1.12.2023
SKU: NS-1159526
The number of pages: 28
Approximate weight : 84 g (0.19 lbs)
Country: Czech technical standard
Category: Technical standards ČSN

The category - similar standards:

Semiconductor devices in general

Annotation of standard text ČSN EN IEC 63287-2 (358777):

Tato norma poskytuje směrnice pro sestavení kvalifikačních plánů spolehlivosti s využitím konceptu profilu nasazení na základě environmentálních podmínek a navrhovaného použití produktu. Tento dokument není určen pro vojenské a kosmické aplikace

We recommend:

Technical standards updating

Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.

Would you like to know more? Look at this page.




Cookies Cookies

We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.

You can refuse consent here.

Here you can customize your cookie settings according to your preferences.

We need your consent to use the individual data so that you can see information about your interests, among other things.