We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer.
STANDARD published on 1.8.2008
Designation standards: DIN EN 60749-37:2008-08
Note: WITHDRAWN
Publication date standards: 1.8.2008
SKU: NS-237831
The number of pages: 22
Approximate weight : 66 g (0.15 lbs)
Country: German technical standard
Category: Technical standards DIN
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 37: Prüfverfahren Fall der Leiterplatte unter Verwendung eines Beschleunigungs-Messgerätes.
Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.
Would you like to know more? Look at this page.
Latest update: 2024-09-25 (Number of items: 2 350 354)
© Copyright 2024 NORMSERVIS s.r.o.