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Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory.
STANDARD published on 1.10.2008
Designation standards: DIN EN 60749-38:2008-10
Publication date standards: 1.10.2008
SKU: NS-237832
The number of pages: 14
Approximate weight : 42 g (0.09 lbs)
Country: German technical standard
Category: Technical standards DIN
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 38: Soft-Error-Prüfverfahren für Halbleiterbauelemente mit Speicher.
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