We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge.
STANDARD published on 1.2.2012
Designation standards: DIN EN 60749-40:2012-02
Publication date standards: 1.2.2012
SKU: NS-237835
The number of pages: 23
Approximate weight : 69 g (0.15 lbs)
Country: German technical standard
Category: Technical standards DIN
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 40: Prüfverfahren zum Fall einer Leiterplatte unter Verwendung von Dehnungsmessstreifen.
1.12.2011
1.3.2012
1.12.2011
1.2.2008
1.6.2011
1.12.2010
Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.
Would you like to know more? Look at this page.
Latest update: 2024-09-25 (Number of items: 2 350 354)
© Copyright 2024 NORMSERVIS s.r.o.