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Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs).
STANDARD published on 1.12.2010
Designation standards: DIN EN 62417:2010-12
Publication date standards: 1.12.2010
SKU: NS-239835
The number of pages: 9
Approximate weight : 27 g (0.06 lbs)
Country: German technical standard
Category: Technical standards DIN
Halbleiterbauelemente - Prüfverfahren auf mobile Ionen für Feldeffekttransistoren mit Metall-Oxid-Halbleiter (MOSFET).
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