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Standard DIN EN IEC 60749-28:2024-12 1.12.2024 preview

DIN EN IEC 60749-28:2024-12

VDE 0884-749-28. Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level.

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STANDARD published on 1.12.2024


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The information about the standard:

Designation standards: DIN EN IEC 60749-28:2024-12
Publication date standards: 1.12.2024
SKU: NS-1205852
The number of pages: 51
Approximate weight : 153 g (0.34 lbs)
Country: German technical standard
Category: Technical standards DIN

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The category - similar standards:

Semiconductor devices in general

Annotation of standard text DIN EN IEC 60749-28:2024-12 :

VDE 0884-749-28. Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 28: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Charged Device Model (CDM) - Device Level.

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