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Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates.
STANDARD published on 1.11.2012
Designation standards: E DIN EN 62047-22:2012-11
Note: WITHDRAWN
Publication date standards: 1.11.2012
SKU: NS-292597
The number of pages: 14
Approximate weight : 42 g (0.09 lbs)
Country: German technical standard (Draft)
Category: Technical standards DIN
Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 22: Elektromechanisches Zug-Prüfverfahren für leitfähige Dünnschichten auf flexiblen Substraten.
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Latest update: 2024-09-25 (Number of items: 2 350 354)
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