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  4. Standard "GB/T 26068-2010"
WITHDRAWN GB/T 26068-2010 10.1.2011 preview

GB/T 26068-2010

Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance

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STANDARD published on 10.1.2011


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Price1 198.80 USD excl. VAT
1 198.80 USD

The information about the standard:

Designation standards: GB/T 26068-2010
Note: WITHDRAWN
Publication date standards: 10.1.2011
SKU: NS-881201
Country: Chinese technical standard
Category: Technical standards GB

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