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  4. Standard "GB/T 32280-2015"
WITHDRAWN GB/T 32280-2015 10.12.2015 preview

GB/T 32280-2015

Test method for warp of silicon wafers—Automated non-contact scanning method

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STANDARD published on 10.12.2015


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Price574.80 USD excl. VAT
574.80 USD

The information about the standard:

Designation standards: GB/T 32280-2015
Note: WITHDRAWN
Publication date standards: 10.12.2015
SKU: NS-649069
Country: Chinese technical standard
Category: Technical standards GB

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