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Test methods for measuring resistivity of semiconductor wafers or sheet resistance of semiconductor films with a noncontact eddy-current gauge
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STANDARD published on 30.10.2009
Designation standards: GB/T 6616-2009
Note: WITHDRAWN
Publication date standards: 30.10.2009
SKU: NS-888239
Country: Chinese technical standard
Category: Technical standards GB
Latest update: 2024-09-16 (Number of items: 2 433 731)
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