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IEC 60748-20-1-ed.1.0
Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination
STANDARD published on 1.3.1994
The information about the standard:
Designation standards: IEC 60748-20-1-ed.1.0
Publication date standards: 1.3.1994
SKU: NS-411338
The number of pages: 55
Approximate weight : 165 g (0.36 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 60748-20-1-ed.1.0 :
The purpose of these examinations is to check the internal materials, construction and workmanship of film and hybrid integrated circuits (F and HFICs). These examinations will normally be used prior to tapping or encapsulation to detect and eliminate the F and HFICs with internal defects that could lead to device failure in normal application. Other acceptance criteria may be agreed upon with the purchaser or supplier, respectively. Le but de ces examens est de verifier les materiaux internes, la construction et la qualite dexecution des circuits integres a couches et hybrides a couches (C et CIHC). Ces examens seront normalement effectues prealablement a la fermeture du boitier ou a lencapsulation afin de detecter et deliminer les C et CIHC dont les defauts internes pourraient mener a un echec du dispositif dans son fonctionnement normal. Dautres criteres dacceptation peuvent etre negocies respectivement avec lacheteur ou le fournisseur.
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