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IEC 62435-2-ed.1.0
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms
Translate name
STANDARD published on 24.1.2017
The information about the standard:
Designation standards: IEC 62435-2-ed.1.0
Publication date standards: 24.1.2017
SKU: NS-674450
The number of pages: 36
Approximate weight : 108 g (0.24 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 62435-2-ed.1.0 :
IEC 62435-2:2017 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with IEC 62435-1:2017 for any device long-term storage whose duration may be more than 12 months for product scheduled for long duration storage. L’IEC 62435-2:2017 a trait aux mecanismes de deterioration et traite de la facon dont les composants se degradent dans le temps en fonction des conditions de stockage appliquees. La presente partie contient aussi des preconisations sur les methodes d’essai qui peuvent etre utilisees pour evaluer les mecanismes de deterioration generiques. Elle s’utilise habituellement conjointement avec l’IEC 62435-1:2017 pour tout stockage de dispositifs dont la duree peut etre superieure a 12 mois, pour un produit destine a etre stocke pendant une duree prolongee.
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