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Optical circuit boards - Basic test and measurement procedures - Part 2: General guidance for definition of measurement conditions for optical characteristics of optical circuit boards
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STANDARD published on 24.5.2017
Designation standards: IEC 62496-2-ed.1.0
Publication date standards: 24.5.2017
SKU: NS-684323
The number of pages: 39
Approximate weight : 117 g (0.26 lbs)
Country: International technical standard
Category: Technical standards IEC
IEC 62496-2:2017 specifies a method of defining the conditions for measurements of optical characteristics of optical circuit boards. The method comprises the use of code reference look-up tables to identify different critical aspects of the measurement environment. The values extracted from the tables are used to construct a measurement identification code, which, in itself, captures sufficient information about the measurement conditions, so as to ensure consistency of independently measured results within an acceptable margin. Recommended measurement conditions are specified to minimise further variation in independently measured results. IEC 62496-2:2017 specifie une methode pour definir les conditions de mesure des caracteristiques optiques des cartes a circuits optiques. La methode inclut lutilisation de tableaux presentant des references a des codes pour identifier differents aspects critiques de lenvironnement de mesure. Les valeurs extraites des tableaux sont utilisees pour construire un code didentification des mesures qui contient suffisamment dinformations sur les conditions de mesure, afin dassurer la coherence des resultats mesures de maniere independante avec une marge acceptable. Des conditions de mesure recommandees sont specifiees pour reduire le plus possible les variations des resultats mesures de maniere independante. Mots cles: densites de largeur de bande, caracteristiques optiques des cartes a circuits optiques
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