We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification
STANDARD published on 7.11.2007
Designation standards: IEC 62527-ed.1.0
Publication date standards: 7.11.2007
SKU: NS-414730
The number of pages: 39
Approximate weight : 117 g (0.26 lbs)
Country: International technical standard
Category: Technical standards IEC
STIL language constructs are defined to specify the DC conditions necessary to excute digital vectors on automated test equipment(ATE). STIL language extensions include structures for:(a) specifying the DC conditions for a device under test; specifying DC conditions either globally, by pattern burst, by pattern, or by vector;(c) specifying alternate DC levels;and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.
Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.
Would you like to know more? Look at this page.
Latest update: 2024-09-27 (Number of items: 2 350 600)
© Copyright 2024 NORMSERVIS s.r.o.