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Standard IEC 62899-503-1-ed.1.0 27.5.2020 preview

IEC 62899-503-1-ed.1.0

Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor

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STANDARD published on 27.5.2020


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The information about the standard:

Designation standards: IEC 62899-503-1-ed.1.0
Publication date standards: 27.5.2020
SKU: NS-994595
The number of pages: 15
Approximate weight : 45 g (0.10 lbs)
Country: International technical standard
Category: Technical standards IEC

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The category - similar standards:

Semiconducting materialsTransistors

Annotation of standard text IEC 62899-503-1-ed.1.0 :

IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).

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