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IEC 62951-2-ed.1.0
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices
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STANDARD published on 17.4.2019
The information about the standard:
Designation standards: IEC 62951-2-ed.1.0
Publication date standards: 17.4.2019
SKU: NS-947696
The number of pages: 21
Approximate weight : 63 g (0.14 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 62951-2-ed.1.0 :
IEC 62951-2:2019 specifies terms, definitions, symbols, configurations and evaluation methods that can be used to evaluate and determine the performance characteristics of flexible thin-film transistor (TFT) devices. This document specifies test methods and characteristic parameters for accurately evaluating the performance and reliability in practical use of flexible TFT devices under the bending status. L’IEC 62951-2:2019 specifie les termes, definitions, symboles, configurations et methodes d’evaluation pouvant etre utilises pour evaluer et determiner les caracteristiques de performance des dispositifs a transistors en couche mince (TFT) souples. Le present document specifie les methodes d’essai et les parametres caracteristiques permettant d’evaluer precisement, dans le cadre d’une utilisation pratique, la performance et la fiabilite des dispositifs TFT souples soumis a une contrainte de courbure.
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