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IEC 62951-4-ed.1.0
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
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STANDARD published on 27.2.2019
The information about the standard:
Designation standards: IEC 62951-4-ed.1.0
Publication date standards: 27.2.2019
SKU: NS-938048
The number of pages: 26
Approximate weight : 78 g (0.17 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 62951-4-ed.1.0 :
IEC 62951-4:2019 specifies an evaluation method of the bending fatigue properties of conductive thin film and flexible substrate for the application at flexible semiconductor devices. The films include any films deposited or bonded onto a non-conductive flexible substrate such as thin metal film, transparent conducting electrode, and thin silicon film used for flexible semiconductor devices. The electrical and mechanical behaviours of films on the substrate are evaluated. The fatigue test methods include dynamic bending fatigue test and static bending fatigue test. L’IEC 62951-4:2019 specifie une methode d’evaluation des proprietes de fatigue en flexion des couches souples conductrices et des substrats souples pour lapplication a des dispositifs semiconducteurs souples. Les couches comprennent toute couche deposee ou collee sur un substrat souple non conducteur telle qu’une couche metallique mince, une electrode conductrice transparente et une couche de silicium mince utilisee pour des dispositifs a semiconducteurs souples. Levaluation porte sur les comportements electriques et mecaniques des couches sur les substrats. Les methodes d’essai de fatigue comprennent l’essai de fatigue en flexion dynamique et l’essai de fatigue en flexion statique.
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