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IEC 62969-4-ed.1.0
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors
Translate name
STANDARD published on 18.6.2018
The information about the standard:
Designation standards: IEC 62969-4-ed.1.0
Publication date standards: 18.6.2018
SKU: NS-851454
The number of pages: 39
Approximate weight : 117 g (0.26 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 62969-4-ed.1.0 :
IEC 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface. L’IEC 62969-4:2018 specifie une methode d’essai par injection directe de defaut pour l’interface a semiconducteurs des capteurs de vehicules automobiles, pouvant etre utilisee pour assurer la conformite de l’interface de communication du vehicule.
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