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Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™
Automatically translated name:
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™
STANDARD published on 14.12.2015
Designation standards: IEC 63003-ed.1.0
Publication date standards: 14.12.2015
SKU: NS-623069
The number of pages: 162
Approximate weight : 517 g (1.14 lbs)
Country: International technical standard
Category: Technical standards IEC
IEC 63003:2015(E) the scope is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.
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