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IEC 63185-ed.2.0
Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method
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STANDARD published on 19.3.2025
The information about the standard:
Designation standards: IEC 63185-ed.2.0
Publication date standards: 19.3.2025
SKU: NS-1216490
The number of pages: 28
Approximate weight : 84 g (0.19 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 63185-ed.2.0 :
IEC 63185:2025 relates to a measurement method for complex permittivity of dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes and that of fringing fields are taken into account accurately on the basis of the mode-matching analysis. This second edition cancels and replaces the first edition published in 2020. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) the upper limit of the applicable frequency range has been extended from 110 GHz to 170 GHz; b) circular disk resonators used for the measurements now include one with waveguide interfaces; c) in calculating the complex permittivity from the measured resonant properties, the fringing fields are now accurately taken into account based on the mode-matching analysis. LIEC 63185:2025 traite d’une methode de mesure de la permittivite complexe des substrats dielectriques aux frequences micro-ondes et millimetriques. Cette methode a ete elaboree pour evaluer les proprietes dielectriques des materiaux a faible perte utilises dans les circuits et dispositifs aux frequences micro-ondes et millimetriques. Cette methode utilise les modes d’ordre superieur d’un resonateur symetrique a disque circulaire, et permet d’effectuer le mesurage large bande de substrats dielectriques a l’aide dun resonateur qui, sous l’effet des ports d’excitation, produit un champ de franges qui sont prises en compte precisement par un ajustement d’analyse modale. Cette deuxieme edition annule et remplace la premiere edition parue en 2020. Cette edition constitue une revision technique. Cette edition inclut les modifications techniques majeures suivantes par rapport a ledition precedente: a) la limite superieure de la plage de frequences applicable a ete etendue de 110 GHz a 170 GHz; b) les resonateurs a disque circulaire utilises pour le mesurage comprennent desormais un resonateur avec des interfaces de guide d’ondes; c) lors du calcul de la permittivite complexe a partir des proprietes de resonance mesurees, les champs de franges sont desormais pris en compte precisement par un ajustement d’analyse modale.
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