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IEC 63287-1-ed.1.0
Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
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STANDARD published on 25.8.2021
The information about the standard:
Designation standards: IEC 63287-1-ed.1.0
Publication date standards: 25.8.2021
SKU: NS-1034229
The number of pages: 86
Approximate weight : 289 g (0.64 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 63287-1-ed.1.0 :
IEC 63287-1:2021 gives guidelines for reliability qualification plans of semiconductor integrated circuit products. This document is not intended for military- and space-related applications. NOTE 1 The manufacturer can use flexible sample sizes to reduce cost and maintain reasonable reliability by this guideline adaptation based on EDR-4708, AEC Q100, JESD47 or other relevant document can also be applicable if it is specified. NOTE 2 The Weibull distribution method used in this document is one of several methods to calculate the appropriate sample size and test conditions of a given reliability project. This first edition of IEC 63287-1 cancels and replaces the first edition of IEC 60749-43 published in 2017. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: the document has been renamed and renumbered to distinguish it from the IEC 60749 (all parts); a new section concerning the concept of "family" has been added with appropriate renumbering of the existing text. L’IEC 63287-1:2021 fournit des lignes directrices concernant les plans de qualification de la fiabilite des produits de CI a semiconducteurs. Le present document n’est pas destine aux applications militaires et spatiales. NOTE 1 Le fabricant peut utiliser des tailles d’echantillons flexibles afin de reduire les couts tout en maintenant une fiabilite raisonnable par l’adaptation des presentes lignes directrices fondees sur l’EDR-4708. S’ils sont specifies, les documents AEC Q100, JESD47 ou tout autre document pertinent specifie peuvent egalement etre applicables. NOTE 2 La methode de la loi de Weibull utilisee dans le present document n’est qu’une methode parmi d’autres permettant de calculer la taille d’echantillon et les conditions d’essai appropriees pour un projet de fiabilite donne. Cette premiere edition de l’IEC 63287-1 annule et remplace la premiere edition de l’IEC 60749-43 parue en 2017. Cette edition constitue une revision technique. Cette edition inclut les modifications techniques majeures suivantes par rapport a ledition precedente: le document a ete renomme et renumerote afin de le differencier de l’IEC 60749 (toutes les parties); une nouvelle section portant sur le concept de famille a ete ajoutee avec une renumerotation appropriee du texte existant.
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