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Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection
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STANDARD published on 14.12.2022
Designation standards: IEC 63364-1-ed.1.0
Publication date standards: 14.12.2022
SKU: NS-1097066
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: International technical standard
Category: Technical standards IEC
IEC 63364-1:2022 specifies terms, the test method, and the report of sound variation detection system based on IoT. It provides the evaluation method for each part of the sound variation detection system based on IoT in the block diagram, the characterization parameters, symbols, test setups and the conditions. In addition, this document defines the configuration items and criteria of standard space and firing situation for the quality evaluation measurement of sound field variation detection system with IoT. L’IEC 63364-1:2022 specifie les termes, la methode d’essai et le rapport du systeme de detection de variation acoustique base sur l’IDO. Elle fournit la methode d’evaluation pour chaque partie du systeme de detection de variation acoustique base sur l’IDO dans le schema de principe, les parametres de caracterisation, les symboles, les montages d’essai et les conditions. En outre, le present document definit les elements de configuration et les criteres de l’espace normalise et de la situation d’application de flamme pour la mesure de l’evaluation de la qualite du systeme de detection de variation de champ acoustique avec IDO.
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