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Device embedded substrate - Part 2-2: Guidelines - Electrical testing
STANDARD published on 4.12.2015
Designation standards: IEC/TR 62878-2-2-ed.1.0
Publication date standards: 4.12.2015
SKU: NS-623041
The number of pages: 29
Approximate weight : 87 g (0.19 lbs)
Country: International technical standard
Category: Technical standards IEC
IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate. LIEC 62878-2-2:2015 decrit les informations necessaires aux essais electriques de substrat avec appareil(s) integre(s). Elle decrit en outre les essais dinterconnexion en circuit ouvert et en court-circuit et lessai fonctionnel de lappareil. Elle fournit egalement des directives de demonstration des essais electriques de substrat avec appareil(s) integre(s).
Latest update: 2024-09-04 (Number of items: 2 346 114)
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