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Standard IEC/TR 63133-ed.1.0 11.10.2017 preview

IEC/TR 63133-ed.1.0

Semiconductor devices - Scan based ageing level estimation for semiconductor devices

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STANDARD published on 11.10.2017


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The information about the standard:

Designation standards: IEC/TR 63133-ed.1.0
Publication date standards: 11.10.2017
SKU: NS-798321
The number of pages: 17
Approximate weight : 51 g (0.11 lbs)
Country: International technical standard
Category: Technical standards IEC

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Semiconductor devices in general

Annotation of standard text IEC/TR 63133-ed.1.0 :

IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.

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