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IEC/TS 61945-ed.1.0
Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis
STANDARD published on 10.3.2000
The information about the standard:
Designation standards: IEC/TS 61945-ed.1.0
Publication date standards: 10.3.2000
SKU: NS-408086
The number of pages: 23
Approximate weight : 69 g (0.15 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC/TS 61945-ed.1.0 :
Gives the methodology for technology and failure analysis in manufacturing integrated circuits. Technology analysis is used to determine the way a component is built by observing it using adequate resolution, which increases progressively with the level of analysis. Decrit la methodologie danalyse technologique et de defaillance au cours de la fabrication des circuits integres. Lanalyse technologique a pour but de determiner la constitution dun composant par des observations utilisant des moyens dont le pouvoir de resolution est progressif avec le degre danalyse. considere.
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