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IEC/TS 62607-9-1-ed.1.0
Nanomanufacturing - Key control characteristics - Part 9-1: Traceable spatially resolved nano-scale stray magnetic field measurements - Magnetic force microscopy
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STANDARD published on 14.10.2021
The information about the standard:
Designation standards: IEC/TS 62607-9-1-ed.1.0
Publication date standards: 14.10.2021
SKU: NS-1041433
The number of pages: 63
Approximate weight : 189 g (0.42 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC/TS 62607-9-1-ed.1.0 :
IEC TS 62607-9-1:2021(E) establishes a standardized method to characterize spatially varying magnetic fields with a spatial resolution down to 10 nm for flat magnetic specimens by magnetic force microscopy (MFM). MFM primarily detects the stray field component perpendicular to the sample surface. The resolution is achieved by the calibration of the MFM tip using magnetically nanostructured reference materials.
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