We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Device embedded substrate - Part 2-4: Guidelines - Test element groups (TEG)
STANDARD published on 27.3.2015
Designation standards: IEC/TS 62878-2-4-ed.1.0
Publication date standards: 27.3.2015
SKU: NS-583707
The number of pages: 75
Approximate weight : 225 g (0.50 lbs)
Country: International technical standard
Category: Technical standards IEC
IEC TS 62878-2-4:2015 describes the test element group devices useful when measuring basic properties of device embedded substrates. It is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components. LIEC TS 62878-2-4:2015 decrit les appareils du groupe delements dessai utiles pour mesurer les proprietes de base des substrats avec appareil(s) integre(s). Il est applicable aux substrats avec appareil(s) integre(s) fabriques a partir de materiaux de base organiques, y compris par exemple les appareils actifs ou passifs, les composants discrets formes lors du processus de fabrication dune carte de cablage electronique, ainsi que les composants de feuilles minces.
27.11.2008
29.11.2012
19.12.2001
29.11.2012
21.4.2010
21.4.2010
Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.
Would you like to know more? Look at this page.
Latest update: 2024-09-04 (Number of items: 2 346 114)
© Copyright 2024 NORMSERVIS s.r.o.