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IEC/TS 62916-ed.1.0
Photovoltaic modules - Bypass diode electrostatic discharge susceptibility testing
Translate name
STANDARD published on 10.4.2017
The information about the standard:
Designation standards: IEC/TS 62916-ed.1.0
Publication date standards: 10.4.2017
SKU: NS-680826
The number of pages: 13
Approximate weight : 39 g (0.09 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC/TS 62916-ed.1.0 :
IEC TS 62916:2017(E) describes a discrete component bypass diode electrostatic discharge (ESD) immunity test and data analysis method. The test method described subjects a bypass diode to a progressive ESD stress test and the analysis method provides a means for analyzing and extrapolating the resulting failures using the two-parameter Weibull distribution function. It is the object of this document to establish a common and reproducible test method for determining diode surge voltage tolerance consistent with an ESD event during the manufacturing, packaging, transportation or installation processes of PV modules.
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