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IEEE 1450-2023
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
Translate name
STANDARD published on 24.4.2024
The information about the standard:
Designation standards: IEEE 1450-2023
Publication date standards: 24.4.2024
SKU: NS-1182457
The number of pages: 147
Approximate weight : 472 g (1.04 lbs)
Country: International technical standard
Category: Technical standards IEEE
Annotation of standard text IEEE 1450-2023 :
Revision Standard - Active.
Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined in this standard that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.
ISBN: 979-8-8557-0629-1, 979-8-8557-0630-7
Number of Pages: 147
Product Code: STD26865, STDPD26865
Keywords: automatic test pattern generator, ATPG, BIST, built-in self-test, CAE, computer-aided engineering, cyclize, device under test, digital test vectors, DUT, event, functional vectors, IEEE 1450™, pattern, scan vectors, signal, structural vectors, timed event, waveform, waveshape
Category: Test Technology
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